Oxford Instruments Asylum Research Releases nanoTDDB high voltage accessory for Jupiter XR, Large Sample Atomic Force Microscope

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Oct 31, 2022

Oxford Instruments Asylum Research today announces the release of its new nanoscale time-dependent dielectric breakdown (nanoTDDB) high voltage accessory for the Jupiter+XR+atomic+force+microscope (AFM). The NanoTDDB technique measures the voltage at which a material undergoes dielectric breakdown. This unique nanoTDDB accessory expands the range of electrical characterization tools available on Jupiter XR, allowing for advanced measurements in the fields of semiconductors, 2D materials, thin films and polymers.