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Aehr Test Systems (Aehr Test Systems) Net Debt Paydown Yield % : -1.19% (As of May. 01, 2024)


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What is Aehr Test Systems Net Debt Paydown Yield %?

Net Debt Paydown Yield % is a metric that evaluates the total amount of debt a company has paid in relation to its market capitalization. It is a measure of a company's willingness and ability to reduce its debt. As of today, Aehr Test Systems's Net Debt Paydown Yield % was -1.19%.


Aehr Test Systems Net Debt Paydown Yield % Historical Data

The historical data trend for Aehr Test Systems's Net Debt Paydown Yield % can be seen below:

* For Operating Data section: All numbers are indicated by the unit behind each term and all currency related amount are in USD.
* For other sections: All numbers are in millions except for per share data, ratio, and percentage. All currency related amount are indicated in the company's associated stock exchange currency.

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Aehr Test Systems Net Debt Paydown Yield % Chart

Aehr Test Systems Annual Data
Trend May14 May15 May16 May17 May18 May19 May20 May21 May22 May23
Net Debt Paydown Yield %
Get a 7-Day Free Trial Premium Member Only Premium Member Only - 8.42 -2.69 1.34 -0.24

Aehr Test Systems Quarterly Data
May19 Aug19 Nov19 Feb20 May20 Aug20 Nov20 Feb21 May21 Aug21 Nov21 Feb22 May22 Aug22 Nov22 Feb23 May23 Aug23 Nov23 Feb24
Net Debt Paydown Yield % Get a 7-Day Free Trial Premium Member Only Premium Member Only Premium Member Only Premium Member Only Premium Member Only Premium Member Only Premium Member Only Premium Member Only Premium Member Only Premium Member Only Premium Member Only Premium Member Only - -0.24 -0.26 -0.82 -0.88

Competitive Comparison of Aehr Test Systems's Net Debt Paydown Yield %

For the Semiconductor Equipment & Materials subindustry, Aehr Test Systems's Net Debt Paydown Yield %, along with its competitors' market caps and Net Debt Paydown Yield % data, can be viewed below:

* Competitive companies are chosen from companies within the same industry, with headquarter located in same country, with closest market capitalization; x-axis shows the market cap, and y-axis shows the term value; the bigger the dot, the larger the market cap. Note that "N/A" values will not show up in the chart.


Aehr Test Systems's Net Debt Paydown Yield % Distribution in the Semiconductors Industry

For the Semiconductors industry and Technology sector, Aehr Test Systems's Net Debt Paydown Yield % distribution charts can be found below:

* The bar in red indicates where Aehr Test Systems's Net Debt Paydown Yield % falls into.



Aehr Test Systems Net Debt Paydown Yield % Calculation

Aehr Test Systems's Net Debt Paydown Yield % for the quarter that ended in Feb. 2024 is calculated as:

Net Debt Paydown Yield %
=( TTM Average Debt   (1-Year Ago))-TTM Average Debt )/Market Cap
=( 2.21-6.32 )/470.30062
=-0.88 %

* For Operating Data section: All numbers are indicated by the unit behind each term and all currency related amount are in USD.
* For other sections: All numbers are in millions except for per share data, ratio, and percentage. All currency related amount are indicated in the company's associated stock exchange currency.

* All the data are calculated by TTM values. Note that if a companies is traded in several exchanges, then we calculate the company level data for Net Debt Paydown Yield % using the primary share class stock data. The calculation result in definition page is for demonstration purpose only, and it's showing the share class level data. Therefore, the numbers in the calculation may differ from elsewhere if the stock is not a primary share.


Aehr Test Systems  (NAS:AEHR) Net Debt Paydown Yield % Explanation

Net Debt Paydown Yield % is the change in average of four quarters of company's total debt over a company's market cap. Assuming the total value of a company remains that same, shareholder value is increased as debt is reduced. In other words, it is a measure of the willingness and ability of a firm's management to pay down debt. Companies that have high debt paydown yields indicate that they are more aggressive with paying down debt.

In the calculation of Net Debt Paydown Yield %, we use the reductions of TTM average total debt one-year-ago and TTM average total debt at present, divided by its Market Cap.

We calculating the TTM average debt by adding up the total debt, calculated by the sum of Short-Term Debt & Capital Lease Obligation and Long-Term Debt & Capital Lease Obligation, in the trailing twelve months(TTM) divided by the counts of the total debt, accoring to the company's report frequency.


Aehr Test Systems Net Debt Paydown Yield % Related Terms

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Aehr Test Systems (Aehr Test Systems) Business Description

Traded in Other Exchanges
Address
400 Kato Terrace, Fremont, CA, USA, 94539
Aehr Test Systems is engaged in test systems for burning-in and testing logic, optical, and memory integrated circuits. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for the company's products in package, wafer level, and singulated die/module level test. The company provides production solutions across the product manufacturing flow to improve yield and reliability and has developed and introduced several innovative products, including the ABTSTM and FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX-XP WaferPak Contactor, FOX DiePak Carrier and FOX DiePak Loader.
Executives
Gayn Erickson director, officer: President & CEO C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
Richmond Donald P. Ii officer: VP of Engineering C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
Vernon Rogers officer: Exe. VP. of Sales & Marketing C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
Chris Siu officer: EXECUTIVE V.P. FINANCE & CFO C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
Alistair N Sporck officer: VP, CONTACTOR BUSINESS UNIT C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
Howard T Slayen director 15353 BARRANCA PARKWAY, IRVINE CA 92618
Geoffrey Gates Scott director C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
Laura Oliphant director C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
Rhea J Posedel officer: CEO and Chairman C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
Kenneth B. Spink officer: VP OF FINANCE & CFO C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
David S Hendrickson officer: VP of Engineering 400 KATO TERRACE, FREMONT CA 94539
Mario M Rosati director, officer: Secretary 650 PAGE MILL RD, PALO ALTO CA 94304
Fariba Danesh director
Adil Engineer officer: Chief Operating Officer C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539
Michael A. Brannan officer: VP of Operations C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT CA 94539