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Hanwool Semiconductor (XKRX:320000) Growth Rank : 0 (As of Jan. 18, 2025)


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What is Hanwool Semiconductor Growth Rank?

Hanwool Semiconductor has the Growth Rank of 0.

GuruFocus Growth Rank measures the growth of a company in terms of its revenue and profitability. Historically, the companies with the highest growth ranks performed the best over the long term. It is calculated using the following criteria:

1. 5-year revenue growth rate, the higher, the better.
2. 3-year revenue growth rate, the higher, the better.
3. 5-year EBITDA growth rate, the higher, the better.
4. The predictability of 5-year revenue. The most consistent it is, the higher the rank.

GuruFocus found that the Growth Rank is the second of the two most-sensitive parameters among the five parameters checked. Please click GF Score to see more details on GF Score's 5 Key Aspects of Analysis.

Please note that we are using the five-year EBITDA growth rate as a parameter, so the company needs to have had positive growth over that time. The reason we use EBITDA instead of earnings per share is that with EBITDA, we can rank a lot more companies since a company may have positive EBITDA but negative EPS. Since we are looking at the growth here, EBITDA gives us a pretty clear picture about the growth in the company's business operations.


Hanwool Semiconductor Growth Rank Related Terms

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Hanwool Semiconductor Business Description

Traded in Other Exchanges
N/A
Address
166 Gosan-ro, Gunpo-si, Gyeonggi-do, SK Ventium 104 Building 1001, Seoul, KOR, 15850
Hanwool Semiconductor Inc formerly Wintec Co Ltd is a technology company developing and producing advanced intelligent inspection equipment in the fields related to OLED, microchip, high-functional film, and X-ray by combining artificial intelligence analysis function based on image processing technology and advanced electrical measurement technology. The company's products inspect the external condition of Micro Chip at high speed; inspects the state of reel tape at high speed; measures the characteristics of Micro Chip (C/DF, IR, BDV); inspects the external condition of the film at high speed.

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